LEXAR LNM760 internal SSD, 512GB M.2 PCIe Gen 4*4 NVMe 2280 SSD – LNM760X512G-RNNNG
by LEXAR
- Model: Lexar LNM760 512GB
- Type: Internal SSD
- Form Factor: M.2 2280
- Interface: PCIe Gen 4x4 NVMe
- Capacity: 512GB
- Sequential Read Speed: Up to 5000 MB/s
- Sequential Write Speed: Up to 4000 MB/s
- 3D NAND Technology: Yes
- DRAM Cache: Yes
- Random Read IOPS: Up to 550,000
- Random Write IOPS: Up to 500,000
- Endurance: 400 TBW (Terabytes Written)
- Mean Time Between Failures (MTBF): 1.8 million hours
- Operating Temperature: 0°C to 70°C
- Dimensions: 80.15 x 22.15 x 2.25 mm
- Weight: Approximately 8 grams
| UPC | LNM760X512G-RNNNG |
|---|---|
| Model Number | LEXAR LNM760 SSD |
| Form | Internal Solid state Drive |
| size | 512GB SSD |
| SKU | 2992903 |
Reviews
Description
LEXAR LNM760 internal SSD, 512GB M.2 PCIe Gen 4*4 NVMe 2280 SSD – LNM760X512G-RNNNG
The Lexar LNM760 512GB Internal SSD is a high-performance storage solution designed to enhance the speed and efficiency of your computing experience. With a form factor of M.2 2280, this SSD leverages the PCIe Gen 4x4 NVMe interface to deliver impressive data transfer rates. It boasts sequential read speeds of up to 5000 MB/s and sequential write speeds of up to 4000 MB/s, ensuring rapid access to files and swift boot times.
The SSD utilizes advanced 3D NAND technology and includes DRAM cache, which contributes to its robust performance. It supports high random read and write IOPS, with up to 550,000 and 500,000 IOPS respectively, making it ideal for demanding applications and multitasking.
With an endurance rating of 400 TBW (Terabytes Written) and a mean time between failures (MTBF) of 1.8 million hours, the Lexar LNM760 is designed for long-term reliability. It operates within a temperature range of 0°C to 70°C, making it suitable for a variety of environments.
